Ключевые слова: HTS, YBCO, thin films, patterning, bridges, fabrication, laser irradiation, substrate single crystal, current-voltage characteristics, microstructure
Ключевые слова: HTS, YBCO, liquid phase epitaxy, fabrication, films epitaxial, substrate single crystal, saturation
Ключевые слова: HTS, NdBCO, doping effect, heat treatment, thermal stability, thin films, substrate single crystal, buffer layers, YBCO, seeding technique, SmBCO, MOCVD process, X-ray diffraction, fabrication
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: HTS, GdBCO, thin films, comparison, doping effect, nanocomposites, oxygenation treatments, pinning, PLD process, substrate single crystal, annealing process, fabrication, X-ray diffraction, microstructure, irreversibility fields, temperature dependence, critical caracteristics, Jc/B curves, critical current density, angular dependence, magnetic field dependence
Ключевые слова: SMES, HTS, YBCO, coils, spiral lines, thin films, substrate Si, stacked blocks, slot-die technique, geometry effects, fabrication, inductance, mechanical properties, stress effects, flux density
Ключевые слова: MgB2, thin films, carbon, ion irradiation, irradiation effects, X-ray diffraction, critical caracteristics, upper critical fields, heat treatment, annealing process, substrate single crystal, HPCVD process, resistive transition, magnetization, critical temperature, lattice parameter, Jc/B curves, experimental results
Ferdeghini C., Braccini V., Putti M., Ghigo G., Gozzelino L., Pallecchi I., Pace S., Grimaldi G., Leo A., Nigro A., Martinelli A., Bellingeri E., Torsello D., Sylva G., Pellegrino L.
Porokhov N.V., Chukharkin M.L., Maresov A.G., Snigirev O.V., Levin E.E., Kalaboukhov A.S., Zenova E.V.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate single crystal, buffer layers, magnetron sputtering, X-ray diffraction, phase composition, microstructure, current-voltage characteristics, temperature dependence, resistive transition, magnetic field dependence, activation energies, critical caracteristics, critical current, flux flow, upper critical fields, experimental results
Wang Z., Ejrnaes M., Cristiano R., Massarotti D., Tafuri F., Salvoni D., Parlato L., Caruso R., Yang X.Y., You L.X., Pepe G.P.
Kudriashov A.V., Klyachkin L.E., Malyarenko A.M., Nashchekin A.V., Romanov V.V., Rykov S.A., Bagraev N.T.
Li M., Xi X.X., Hellstrom E., Davidson B.A., Chen K., Acharya N., Collantes Y., Kasaei L., Manichev V., Feldman L.C., Gustafsson T., Demir M., Bhattarai P.
Ключевые слова: HTS, YBCO, thin films, fabrication, substrate single crystal, buffer layers, PLD process, defects columnar, ion irradiation, irradiation effects, pinning, critical caracteristics, anisotropy, Jc/B curves, X-ray diffraction, microstructure, critical current density, angular dependence, n-value, experimental results
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